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Patent citations as a measure of knowledge flows: The influence of examiner citations
Author(s): Alcacer J (Alcacer, Juan), Gittelman M (Gittelman, Michelle)
Source: REVIEW OF ECONOMICS AND STATISTICS    Volume: 88    Issue: 4    Pages: 774-779    Published: NOV 2006  
Times Cited: 34     References: 13     
Abstract: Analysis of patent citations is a core methodology-in the study of knowledge diffusion. However, citations made by patent examiners have not been separately reported, adding unknown noise to the data. We leverage a recent change in the reporting of patent data showing citations added by examiners. The magnitude is high: two-thirds of citations on the average patent are inserted by examiners. Furthermore, 40% of all patents have all citations added by examiners. We analyze the distribution of examiner and inventor citations with respect to self-citation, distance, technology overlap, and vintage. Results indicate that inferences about inventor knowledge using pooled citations may suffer from bias or overinflated significance levels.
Document Type: Article
Language: English
Reprint Address: Gittelman, M (reprint author), NYU, Stern Sch Business, New York, NY USA
Addresses:
1. NYU, Stern Sch Business, New York, NY USA
Publisher: M I T PRESS, 238 MAIN STREET, STE 500, CAMBRIDGE, MA 02142-1046 USA
Subject Category: Economics; Social Sciences, Mathematical Methods
IDS Number: 105IU
ISSN: 0034-6535
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